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Widely used in I-V/C-V testing, RF/mmW testing, high-power, high-current testing, MEMS, optoelectronic device testing, wafer-level failure analysis, Hall testing, etc.
LD/LED/PD Light intensity/wavelength test electrode /PAD test PCB/ package device Test material/device IV/CV characteristic test device high-frequency characteristic test (up to 300GHZ frequency) rf test, etc.
X series is an integrated and highly efficient semi-automatic wafer probe platform that is specialized in testing the performance of various advanced chips.
TFT-LCD panel bright spot repair, OLED panel bright spot repair.
OLED/LCD panel within 20 "55" and 70 "highlights and abnormal repair.
TFT-LCD and OLED Array Panel circuit open and short circuit repair,Mask defect repair.
Hall Effect System is an integrated software system for high precision measurement of various semiconductor materials.
4 kinds of sub-micron probe bases with different precision are available for customers to choose from (0.1um/0.7um/ 2um /10um)
A mechanical device attached to the pin seat to connect the probe to the signal cable. The fixture used to hold the probe and lead out the signal probe will move linearly in the X-Y-Z direction as the x-Y-Z knob of the pin seat is adjusted.
With a variety of GGB probes to choose from, t-4 series soft needles are mostly applied to the circuit and electrode of point measuring integrated circuit, or the MINI electrode ST series hard needle probes made by FIB(focused ion beam) are applied to most of the chip electrode point measuring and line point measuring.
4 kinds of sub-micron probe bases with different precision are available for customers to choose from (0.1um/0.7um/ 2um /10um)
A mechanical device attached to the pin seat to connect the probe to the signal cable. The fixture used to hold the probe and lead out the signal probe will move linearly in the X-Y-Z direction as the x-Y-Z knob of the pin seat is adjusted.
With a variety of GGB probes to choose from, t-4 series soft needles are mostly applied to the circuit and electrode of point measuring integrated circuit, or the MINI electrode ST series hard needle probes made by FIB(focused ion beam) are applied to most of the chip electrode point measuring and line point measuring.
4 kinds of sub-micron probe bases with different precision are available for customers to choose from (0.1um/0.7um/ 2um /10um)
A mechanical device attached to the pin seat to connect the probe to the signal cable. The fixture used to hold the probe and lead out the signal probe will move linearly in the X-Y-Z direction as the x-Y-Z knob of the pin seat is adjusted.
With a variety of GGB probes to choose from, t-4 series soft needles are mostly applied to the circuit and electrode of point measuring integrated circuit, or the MINI electrode ST series hard needle probes made by FIB(focused ion beam) are applied to most of the chip electrode point measuring and line point measuring.
4 kinds of sub-micron probe bases with different precision are available for customers to choose from (0.1um/0.7um/ 2um /10um)
A mechanical device attached to the pin seat to connect the probe to the signal cable. The fixture used to hold the probe and lead out the signal probe will move linearly in the X-Y-Z direction as the x-Y-Z knob of the pin seat is adjusted.
With a variety of GGB probes to choose from, t-4 series soft needles are mostly applied to the circuit and electrode of point measuring integrated circuit, or the MINI electrode ST series hard needle probes made by FIB(focused ion beam) are applied to most of the chip electrode point measuring and line point measuring.
4 kinds of sub-micron probe bases with different precision are available for customers to choose from (0.1um/0.7um/ 2um /10um)
A mechanical device attached to the pin seat to connect the probe to the signal cable. The fixture used to hold the probe and lead out the signal probe will move linearly in the X-Y-Z direction as the x-Y-Z knob of the pin seat is adjusted.
With a variety of GGB probes to choose from, t-4 series soft needles are mostly applied to the circuit and electrode of point measuring integrated circuit, or the MINI electrode ST series hard needle probes made by FIB(focused ion beam) are applied to most of the chip electrode point measuring and line point measuring.
4 kinds of sub-micron probe bases with different precision are available for customers to choose from (0.1um/0.7um/ 2um /10um)
A mechanical device attached to the pin seat to connect the probe to the signal cable. The fixture used to hold the probe and lead out the signal probe will move linearly in the X-Y-Z direction as the x-Y-Z knob of the pin seat is adjusted.
With a variety of GGB probes to choose from, t-4 series soft needles are mostly applied to the circuit and electrode of point measuring integrated circuit, or the MINI electrode ST series hard needle probes made by FIB(focused ion beam) are applied to most of the chip electrode point measuring and line point measuring.
Quality Assurance
The quality policy is formulated on the basis of the basic principles of quality management, which is the company’s general quality tenet and quality direction; ultimately achieve customer satisfaction as the goal, to ensure that customer needs and e
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After-sales service
SEMISHARE is committed to providing customers with a full range of support services such as product consulting, program construction, product customization, delivery and acceptance, skills training, tracking maintenance, etc.
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FAQ
When you use this equipment, you may encounter some problems. The following table lists common faults and solutions for your reference.
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Whether you are a research university, research institute, chip design company, fab, packaging and testing plant, panel factory, etc.
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Core technologies
Probe Station Solution
Laser system solution