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Precision Probe Holders for Semiconductor Testings

Explore high-precision probe holders designed to optimize your semiconductor testing setup. Discover SEMISHARE Prober's reliable probe holder solutions.

Headline: Specialized Probe Holders - Critical for Signal Integrity

The Evolving Probe Holder Needs

As semiconductor integration progresses with nodes scaling past a few nanometers, the demands on probe holders have intensified, necessitating focused mechanical innovations to address emerging challenges. These holders are now crucial in achieving uniform compliant forces across contacts, ensuring secured yet minimized landing disturbances. This is particularly vital as the industry moves towards more complex, uneven, and non-planar device surfaces, including heterogeneous modular stacking. The need for flexible holder constructions has never been greater, facilitated through advanced modeling techniques. However, standard catalog probe holder solutions often confront limitations when faced with novel pad materials, customized landing strategies, and the adoption of new test methodologies, hampering coverage and efficiency. The evolving landscape of semiconductor testing requires probe holders that can adapt to these changes, ensuring that they can provide reliable and accurate contact with a variety of pad materials and configurations. As the complexity of semiconductor devices increases, so does the need for more sophisticated probe holders capable of meeting these advanced requirements.

Specialized Probe Holders Promise Overcoming Challenges

In seeking solutions to overcome these limitations, purpose-built probe holders offer a targeted remedy, addressing shortfalls through tailored geometries. Advanced probe holders now incorporate proprietary pressure equalization or clamping techniques, uniformly distributing landing forces to prevent damage while extending the service lifetimes of probes. These models-driven precision machined angular motion articulations maintain proper orientation across uneven die stacks, assuring planarity for reliable measurements extractions. By matching specific contact pad varieties and densities, these advanced probe holders avoid the tradeoffs associated with selecting standard catalog holders, thus enabling maximal test coverage. The development of these specialized probe holders marks a significant step forward in the field of semiconductor testing, offering a level of precision and adaptability that was previously unattainable. These advancements are crucial in ensuring that semiconductor testing can keep pace with the rapid advancements in device complexity and miniaturization.

SEMISHARE Probe Holders Advancement Leadership

SEMISHARE has been at the forefront of addressing these quandaries for decades, heralding probe holder capabilities forged over years of testing instruments development. Our patented pressure balancing schemes on customizable holders distribute loads evenly, preventing premature wearing or catastrophic failures. Our extensive mechanical proficiency also readily provides angular offsets, realigning probe access precisely to compensate for package warpage through mounting flexibilities. These purpose-built probe holders thus continue to provide unmatched measurement consistency, upholding signal fidelity and meeting the demands for next-generation IC testing solutions globally. SEMISHARE's commitment to innovation in probe holder technology is evident in its ability to provide solutions that are not only effective but also highly customizable, ensuring that they can meet the specific needs of each client.

Assured Reliability and Measurement Repeatability

The cumulative expertise of SEMISHARE translates into probe holders that deliver consistent micron-level accurate landing precision, despite multiplying probing pressures. Custom calibrated software routines automate precise motions, preventing ungainly contact scrubs. Advanced composite materials resist distortions from mounting strains or thermal transients, eliminating shifts between operating environments. Our probe holders thereby deliver uncompromised connection stability, securing design quantification accuracy long-term repeatably, even through punishing test campaigns. This level of reliability and repeatability is essential in the semiconductor industry, where even the smallest inaccuracies can have significant consequences. SEMISHARE's probe holders are designed to provide consistent performance, ensuring that each test is as accurate and reliable as the last.

Collaborative Probe Holders Innovations

Preemptive collaborative strategies allow effective test budgets balancing through risk and reward sharing, leveraging collective application knowledge to guide purpose-built solutions. Early engagements facilitate test sockets evolutions in sync with probing interconnect dimensions. Our design excellence thus manifests quality differentiations precisely matching budget milestones on agreed commitments timescales, demonstrating deeper symbiotic success. This collaborative approach to probe holder innovation ensures that the solutions developed are not only technically advanced but also economically viable, meeting the needs of both SEMISHARE and its partners. By working closely with clients and other stakeholders, SEMISHARE is able to develop probe holders that are perfectly tailored to the specific requirements of each application, ensuring the highest levels of performance and satisfaction.

 
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Recommended reading

Why are highly customized probe holders crucial for advanced CMOS testing today?

Highly customized probe holders are crucial for advanced CMOS testing today because they can deliver uniformly compliant force across array contacts preventing premature damage while securing reliable measurements on fragile nodes and emerging 3D integration packages.

What new probe holder capabilities facilitate heterogeneous integrated technologies validation?

Purpose-built probe holders incorporating mechatronic positioners provide wide orientation variability compensation via adjustable angular offsets to reliably access recessed surfaces and uneven dies stacks enabling viable heterogeneous modules validation through accurate nonplanar device quantification otherwise confronting challenges handling such contours.

How do precision probe holders aid landing damage prevention during wafer test?

Precision probe holders with calibrated pressure uniformity loading and innovative compliance constructs ensures consistent planarity and tip parallelism across entire fragile wafers preventing harmful touchdown scrubs or lateral shearing responsible for premature cracking failures during cyclic wafer test or parameter extractions.

Probe Holder

Standard/Sizes

Probe  Holder

Probe Holder

Triaxial Probe Holder

Specification:The Probe Holder is a mechanical device attached to the pin seat to connect the probe and the signal cable for fixing the probe and extracting the signal.

Size:Please first select the model of pin seat according to the size of the test electrode, and then determine the use of ordinary cable, coaxial cable or three-axis cable at the back end of the probe fixture according to the telecom test accuracy.

Features:Triaxial Probe Holder: The triaxial probe jig rear end is connected with a 1.2m long triaxial cable with triaxial (male) interface, and the telecommunication test accuracy is better than 100fA when using standard shielding box.

Probe Holder

Probe Holder

Coaxial Tip Holder

Specification:The Probe Holder is a mechanical device attached to the pin seat to connect the probe and the signal cable for fixing the probe and extracting the signal.

Size:Please first select the model of pin seat according to the size of the test electrode, and then determine the use of ordinary cable, coaxial cable or three-axis cable at the back end of the probe fixture according to the telecom test accuracy.

Features:The telecommunication test precision of the 1.2m coaxial cable with the BNC interface at the back end of the coaxial probe jig is better than 10 pA when the standard shielding box is used.

Annex

Selection steps

First, select the model of the pin seat according to the size of the test electrode, and then determine the use of ordinary cable, coaxial cable or three-axis cable at the back end of the probe fixture according to the telecom test accuracy. Finally, pay attention to the mechanical precision of the pin seat when choosing whether to use spiral, spring or tubular for the mechanical fixed parts of the fixture.


For more information about this product, you can download the product manual.

     
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0755-2690 6952 turn 801/804/806/814

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