FA series probe bench is a kind of measuring equipment specially designed for failure analysis laboratory. It has optical characteristic, laser characteristic, stable equipment structure, excellent system performance, ergonomic design, convenient operation, support multi-function upgrade, and rich and complete product functions.
|Manual Probe Station
|960mm long *850mm wide *1500mm high
|About 260 kg
Chip Failure Analysis AT room temperature and high and low temperature rf device Failure analysis MATERIAL/device IV/CV characteristic test and Failure analysis Chip internal circuit/electrode /PAD test IC/ panel internal circuit modification/layer removal.
●Large handle drive, no clearance movement. ●Ergonomic design, convenient and comfortable to operate. ●Multi-band laser application, fast switching and accurate cutting. ●Compatible with high power metallographic microscope for fine adjustment and movement. ●No backtrip difference design, accurate positioning. ●The air cooling structure is compact and requires no maintenance. ●High precision system, laser machining accuracy up to 1*1um. ●Leading internal anti - shock system device, more stable operation.