Probe Card for Semiconductor Testing - SEMISHARE Prober
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SEMISHARE's E-Series 150mm Economical Manual Probe Station: A Game-Changer in Semiconductor and Probe Card Testing
SEMISHARE is revolutionizing the semiconductor industry with its E-Series 150mm Economical Manual Probe Station, a pivotal tool in the realm of semiconductor device testing. This probe station, specifically designed for testing semiconductor devices, including probe cards, stands as a testament to SEMISHARE's commitment to innovation and quality. The importance of probe cards in the semiconductor industry cannot be overstated, and SEMISHARE's probe station is at the forefront of meeting this critical need.
The E-Series 150mm Economical Manual Probe Station is engineered with a robust mechanical system, stable structure, and ergonomic design. This design not only ensures ease of use but also supports multi-function upgrades, enhancing its array of product functions. Primarily used in the manufacturing and research fields of integrated circuits, LED, LCD, solar cells, and other industries, the probe station is integral where probe cards are extensively utilized. The versatility of this probe station, especially in handling various types of probe cards, makes it an indispensable tool in the semiconductor industry.
At the heart of this probe station is the POMater™ Adaptive shock-absorbing base, which provides exceptional elastic support. This feature is crucial for the accurate testing of semiconductor devices, including probe cards. The technical characteristics of the E-Series 150mm Economical Manual Probe Station make it suitable for a wide range of applications such as light intensity/wavelength testing, electrode/PAD testing, PCB/package device testing, IV/CV characteristic testing, high-frequency characteristic testing, and RF testing. All these applications are relevant and essential for comprehensive probe card testing.
The E-Series 150mm Economical Manual Probe Station, with its specific product number and detailed specifications, is tailored for a conducive working environment and efficient electricity demand. Its control method, product size, and equipment weight are all designed with the user in mind, ensuring ease of operation. These specifications make it exceptionally suitable for testing a variety of semiconductor devices, including probe cards, thereby addressing a wide range of industry needs.
This probe station finds its applications in various industries, including LD/LED/PD, light intensity/wavelength test, electrode/PAD test, PCB/package device test, IV/CV characteristic test, high-frequency characteristic test (up to 300GHZ frequency), and RF test. Each of these applications plays a significant role in probe card testing, underlining the versatility and indispensability of the E-Series 150mm Economical Manual Probe Station in the semiconductor industry.
In summary, the E-Series 150mm Economical Manual Probe Station from SEMISHARE is a cornerstone in the semiconductor industry, particularly in the testing of probe cards. Its advanced design, technical prowess, and wide range of applications make it a must-have for any operation involved in semiconductor device testing. SEMISHARE invites interested parties to contact them for more information on how this probe station can enhance their testing capabilities, especially in the realm of probe cards.