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Vacuum Probe Station for High-Precision Semiconductor Testing

Vacuum probe station by SEMISHARE offers precise semiconductor testing with advanced vacuum and temperature control.

How Vacuum Probe Stations Enable Precision Semiconductor Testing

In the rapidly evolving semiconductor industry, precise electrical testing and characterization of micro and nanoscale devices are crucial. One of the most effective tools for such applications is the vacuum probe station. This sophisticated testing system is widely used in semiconductor research, material science, and nanoelectronics due to its ability to provide a stable and controlled environment for electrical measurements. This article delves into the features, applications, advantages, and selection criteria for a vacuum probe station, helping researchers and engineers understand its significance in modern technological advancements.

Core Functions of a Vacuum Probe Station

A vacuum probe station is designed to facilitate high-precision probing of semiconductor devices, nanostructures, and optoelectronic components under controlled vacuum conditions. Below are its primary functions:

High-Precision Probing

One of the critical features of a vacuum probe station is its ability to conduct electrical measurements at the micro and nanoscale level. It is equipped with highly precise probe arms and manipulators that allow researchers to contact tiny semiconductor devices with minimal electrical noise and interference. The fine positioning system ensures accurate placement of probes, making it ideal for research requiring extreme precision.

Vacuum Environment Control

A vacuum probe station operates in a controlled vacuum chamber, reducing atmospheric contaminants, oxidation, and external electromagnetic interference. This controlled environment ensures:

•Higher accuracy in electrical measurements

•Improved stability for sensitive experiments

•Prevention of contamination that could affect semiconductor device performance

Temperature Control Capabilities

Many vacuum probe stations come with integrated thermal control features, allowing researchers to perform tests at different temperature ranges. Temperature-controlled probing is essential for:

•Evaluating device behavior under extreme conditions

•Conducting reliability tests

•Studying the impact of temperature on semiconductor performance

Key Technical Specifications

When selecting a vacuum probe station, several key technical parameters should be considered:

•Vacuum Range: The level of vacuum achievable can vary from low vacuum (~1 Torr) to ultra-high vacuum (UHV) (~10^-7 Torr), depending on the research needs.

•Temperature Control Range: Some vacuum probe stations offer cryogenic capabilities down to -200°C, while others can reach temperatures exceeding 300°C.

•Probe Compatibility: The number and types of probes that can be used vary, including RF, DC, and optical probes.

•Instrument Integration: A high-quality vacuum probe station is compatible with semiconductor parameter analyzers, oscilloscopes, and other measurement equipment.

Applications of Vacuum Probe Stations

A vacuum probe station has a wide range of applications across various scientific and industrial fields. Some of the key application areas include:

1.Semiconductor Chip Testing

Semiconductor manufacturers and researchers use vacuum probe stations for testing integrated circuits (ICs), transistors, and other semiconductor components. By providing a clean and stable testing environment, these systems help engineers measure electrical properties such as resistance, capacitance, and current-voltage characteristics.

2.Optoelectronic Device Research

In the development of photonic and optoelectronic devices such as LEDs, laser diodes, and photodetectors, a vacuum probe station allows precise electrical and optical characterization under controlled conditions.

3.Material Science and Nanotechnology

Researchers in material science use vacuum probe stations to study the electrical behavior of new materials, including nanowires, graphene, and 2D materials. These systems enable detailed electrical characterization without interference from atmospheric conditions.

4.MEMS and NEMS Device Evaluation

Microelectromechanical systems (MEMS) and nanoelectromechanical systems (NEMS) require high-precision electrical measurements. A vacuum probe station enables accurate probing of MEMS sensors, actuators, and microdevices under varying environmental conditions.

Advantages of Vacuum Probe Stations

Using a vacuum probe station offers numerous benefits to researchers and engineers. Some of the key advantages include:

1.High Measurement Stability

The vacuum environment minimizes air-related electrical noise and prevents oxidation, leading to more stable and repeatable electrical measurements.

2.Reduced Contamination and Oxidation

By operating in a vacuum, the vacuum probe station prevents contamination that can degrade semiconductor performance. This is especially crucial for sensitive nanomaterials and semiconductor devices.

3.Compatibility with Advanced Testing Equipment

A vacuum probe station is designed to integrate seamlessly with various test instruments, including parameter analyzers, oscilloscopes, and spectrum analyzers, allowing for comprehensive electrical and optical testing.

4.Flexible and Modular Design

Many vacuum probe stations come with modular designs, enabling researchers to customize configurations based on their specific testing requirements. Options such as motorized probe positioning, automated measurements, and environmental control modules enhance the station's versatility.

Choosing the Right Vacuum Probe Station

When selecting a vacuum probe station, it is essential to consider specific factors to ensure it meets the intended application requirements. Here are some key considerations:

1.Define Your Testing Requirements

Different research applications require different vacuum levels, temperature ranges, and probe configurations. Identifying your specific needs will help narrow down the right vacuum probe station.

2.Evaluate Vacuum and Temperature Capabilities

For semiconductor and nanotechnology research, a vacuum probe station with ultra-high vacuum capabilities and precise temperature control is crucial. Consider whether your tests require cryogenic cooling or high-temperature stability.

3.Probe System Compatibility

Ensure the vacuum probe station supports the required probe types, including DC, RF, or optical probes. The station should allow easy integration of additional probe arms if needed.

4.Automation and Control Features

For large-scale research or industrial applications, an automated vacuum probe station with programmable probe positioning and data acquisition capabilities can significantly improve efficiency and accuracy.

The vacuum probe station is an indispensable tool in semiconductor research, optoelectronics, and nanotechnology. With its ability to provide high-precision probing in a controlled vacuum environment, it enables researchers to conduct accurate electrical measurements and material characterization. Whether for chip testing, material science research, or MEMS device evaluation, a vacuum probe station ensures reliability, stability, and efficiency in electrical testing applications. As semiconductor technology continues to evolve, the demand for advanced vacuum probe stations will only grow, further driving innovation in the field of micro and nanoelectronics.

Product Overview Functional structure Specifications Download Video
CGX High-Low Temperature Vacuum Semi-automatic Probe Station

Product Overview

SEMISHARE CGX semi-automatic vacuum high-low temperature probe station is designed for research and specific production applications. It enables rapid and high-precision testing on single wafers in a vacuum environment, temperature range:77K-450K(liquid nitrogen), 10K-450K(liquid helium).

Basic Information

Product number CGX8 working environment Vacuum High-Low Temperature Environment
electricity demand AC220V,50~60HZ Control method Semi-Automatic
Product Size 1150*1450*1800mm equipment weight About 1000KG

Application direction

Based on sample classification: Wafer Testing,LED Testing,Power Device Testing,MEMS Testing,PCB Testing ,LiquidDisplay Panel Testing,Solar Cell Panel Testing,Surface Resistivity Testing. Based on application classification: RF Testing,High-Temperature Environment Testing,Low Current (100fA Level) Testing,I-V/C-V/P-IV Testing,High Voltage, High Current Testing,Magnetic Field Environment Testing,Radiation Environment Testing.

Technical characteristics

Independent research and development of software integration system, more compatibility

●Supports semi-automatic control (manual or automatic testing)
●Automatic wafer calibration, wafer mapping, die size measurement, alignment, and remote access to test data
●One-click automatic calibration of RF probe module, with automatic probe cleaning function
●One-click adaptive four-axis Chuck precision calibration, supporting micrometer-level pad point testing
●Supports single-point or continuous testing
●Strong data storage and processing capabilities
●Ability to divide test results into BIN values and identify NG devices
●Multiple system integration capabilities, allowing independent upgrades of operating systems, application systems, and device testing systems

Air film shock absorption system

The industry's unique internal integration of high-performance air film shock absorption system and the dual design of the external isolation barrier, effectively avoid the vibration caused by the operator's touch;In addition, a long-aging casting is used as the substrate to suppress the vibration in the process of motion at the fastest speed of 1S in the industry to ensure the stable operation of the equipment, and to ensure that the screen does not shake when the image is enlarged at 2000X;At the same time, the high-precision control valve ensures that the height error of the moving part of the platform is 0.1mm, effectively realizing the test ability of fast die to die, ensuring that the whole system can still maintain a stable running state when moving at a high speed, and greatly improving the test efficiency.

Industry leading 3 times imaging technology

12:1 fast and precise motorized zoom microscope, zoom range 0.6~7.2X, image resolution 3.05μm, total magnification range 33X~396X.

The industry's most efficient CHUCK system, test efficiency significantly improved

● High efficient CHUCK test system,running speed≥40mm/s, motion precision≤±1μm , while moving the translocation time index time 500ms, excellent system operating parameters have reached the highest level of the industry, ultra-high test accuracy and efficiency to meet all kinds of wafers and devices of high repeatability and stability test, test efficiency significantly improved
●Temperature control accuracy and stability better than ±0.1℃, providing reliability wafer testing in high and low temperature environments
●The compact structure design of four-dimensional motion with low center of gravity ensures the motion speed of 40mm/s while maintaining the stability of motion acceleration and deceleration

Title

Mechanical Specifications

Chuck

8"

Chuck Flatness

20μm

Probe Arm Positioning Accuracy

2μm

Probe Arm X-axis Travel

10mm

Probe Arm Y-axis Travel

10mm

Probe Arm Z-axis Travel

10mm

Chuck Stage X-axis Travel

200mm

Chuck Stage Y-axis Travel

200mm

Chuck Stage Z-axis Travel

20mm

Chuck Stage Theta-axis Travel

±5°

Chuck Stage Repeated Positioning Accuracy

±1μm

Temperature Control Specifications

Temperature Range

77K-450K (liquid nitrogen), 10K-450K (liquid helium)

Temperature Controller Resolution

0.001℃

Sensor Error

0.5% in any segment

Vacuum Specifications

Leak Rate

1.3x10-9 Pa.M3/s

Turbo Pumping Speed

290L/S

Turbo Pump Ultimate Pressure

5 x 10-10mbar

System Ultimate Pressure

5.0x10-4Pa


Customer Service
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Contact number

Contact number

0755-2690 6952 turn 801/804/806/814

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