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Precision Micromanipulators for Semiconductor Testing

Discover our range of high-precision micromanipulators designed to elevate your semiconductor test capabilities. Explore SEMISHARE for accuracy and efficiency.

 
Product OverviewDownloadVideo
Micropositioner

Standard/Sizes

SS-125-M

SS-125-M

Submicron circuit/RF test Micropositioner

Specification:x-y-z travel direction:14 x 14 x 14mm; Linear motion; Lead screw precision:125 Thread / Inch; Movement accuracy<1 microns

Size:110mmL×51mmW×100mmH,1.1kg

Features:
The axis movement mode is changed from differential head lifting to screw drive, which avoids shaking after collision.
The tooth distance is shorter and the adjustment accuracy is higher.
The handles have different sizes, making the operation process easier to distinguish.

SS-100

SS-100

Submicron circuit/RF test Micropositioner

Specification:X-y-z travel direction;12 x 12x 12mm;Linear motion;Lead screw precision;100 Thread / Inch;Movement accuracy;0.7 microns

Size:115mm long *100mm wide *112mm high;About 1000 grams

Features:● Submicron process IC circuit testing; ● Linear, recoilless movement; ● It can be used with coaxial/triaxial probe fixture; ● The fixture can be tilted at a range of 30 degrees; ● Tungsten probes can be used; ● Rf pins can be configured in east/south/west/North directions; ● Rf test capability; ● DC to 40GHz~120GHz; ● Calibration chip and calibration software can be used together; ● Probe interface and cable connection 45 degrees, no L-type adapter; ● The probe can be removed for maintenance; ● Fixed device with RF test line.

SS-40-T

SS-40-T

Circuit/RF test pins

Specification:X-y-z travel direction;12 x 12x 12mm;Linear motion;Lead screw precision;40 Thread / Inch;Movement accuracy;2 microns

Size:64mm long *47mm wide *66mm high; About 200 grams

Features:● Linear movement; ●I/O Pad spot measurement; ● Circuit point measurement; ● Radio frequency test; ● Smaller volume; ● It can be used with coaxial/triaxial probe fixture.

SS-40

SS-40

I/O Pad/Electro-Optics Test needle holder

Specification:X-y-z travel direction;12 x 12x 12mm;Linear motion;Lead screw precision;40 Thread / Inch;Movement accuracy;10 microns

Size:64mm long *47mm wide *55mm high; About 175 grams

Features:● Affordable price; ● Linear movement; ●I/O Pad spot measurement; ● Point measurement of photoelectric devices; ● Smaller volume; ● It can be used with coaxial/triaxial probe fixture.

SS-700

SS-700

Submicron circuit/RF test Micropositioner

Specification:X-y-z travel direction;8 x 8 x 8mm;Linear motion;Lead screw precision;700 Thread / Inch;Movement accuracy;0.1 microns

Size:148mm long *120mm wide *140mm high; Weighs 1500 grams

Features:Submicron process IC circuit testing;Linear, recoilless movement;Can be used with coaxial/triaxial probe fixture;The fixture can be tilted at a range of 30 degrees;Tungsten probes can be used;Rf pins can be configured in four directions east/south/west/North;Rf testing capability;Dc to 40 GHZ ~ 120 GHZ;Calibration tablets and calibration software can be used together;45 degree connection between probe interface and cable, no L-type adaptor required;The probe can be removed for maintenance;Fixed device with RF test line.

Annex

Triaxial probe clamp
Radiofrequency probe
Coaxial probe jig
Optical fiber probe
Magnetic base, magnetic flip base, vacuum base
Low current/capacitance point measuring fittings
Electric pin holder upgrade
High pressure accessories
     
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Contact number

Contact number

0755-2690 6952 turn 801/804/806/814

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