Our website uses cookies provided by us and third parties. Some cookies are necessary for the operation of the website, and you can adjust other cookies at any time, especially those that help us understand the performance of the website, provide you。

I accept
Phone Number*
Company Name:
Product OverviewFunctional structureSpecificationsDownloadVideo
High And Low Temperature Analysis Probe Station

Product Overview

C series prober has excellent mechanical system, stable structure and performance, ergonomic design, easy operation, support multi-function upgrade, rich and comprehensive functions. This product is mainly used in the manufacturing and research fields of integrated circuit,LED,LCD, solar cell and semiconductor industry.

Basic Information

Product numberC seriesworking environmentHigh and low temperature environment
electricity demand220VC,50~60HzControl methodManual
Product SizeDimensions: 1400 mm * 920 mm * 920 mmequipment weight150KG/170KG/250KG

Application direction

LD/LED/PD test,PCB/ package device test, MATERIAL/device IV/CV characteristic test, internal circuit/electrode /PAD test, hf RF test, etc.r

Technical characteristics

Technical characteristics

Pneumatic type mobile platform has the function of fast moving chuck, can meet the needs of efficient manual test by the corresponding gas float switch, provides three kinds of method of fast moving;Three - stage lifting needle base platform,the needle seat platform can rise and fall rapidly (0,300um,3mm)+ fine adjustment (40mm, moving resolution 2~5μm);built-in 3 zoom multi-view, triple-rate concentric focal path system (internal optical zoom: 0.6:1;2.5:1;9:1);shielding cavity structure design,provides the best low noise and low leakage current capacity.At the same time, it keeps the sample under nitrogen or positive pressure environment at low temperature without frosting, and the unique cavity blowing structure prevents cryogenic frosting.


C series
Model C6 C8 C12
L: 860mm*
W: 850mm*
H: 700mm
L: 880mm*
W: 860mm*
H: 750mm
L: 1400mm*
W: 920mm*
H: 920mm
Weight (about) 150KG 170KG 250KG
Electricity Demand 220VC, 50~60Hz
Chuck Size & Rotation angle 6", 360° Rotation 8", 360° Rotation 12", 360° Rotation
X-Y Moving range 6" * 6" 8" * 8" 12" * 12"
Moving resolution 1μm
Sample exchange Chuck quick move out mechanism for  sample change
Sample fixed mode Vacuum adsorption
Electrical design Chuck Surface is Electrical Floating with Banana plug adapter, can be used as a backside electrode
Platen O shape platen 8 micropositioners available 10 micropositioners available 12 micropositioners available
Move range & adjustment Platen can be quickly lifted up and down 6mm with automatic locking function
Platen can be fine tuned up and down 25mm precisely with 1μm resolution
Temperature specification Temperature range - 100 ~ 300- 80 ~ 300- 60 ~ 300
Temperature precision 0.01°C resolution
heating method Low voltage DC(LVDC)
Minimum temperature control rate ± 0.1°C / hour
Refrigerant Liquid nitrogen or Refrigeration compressor
Microscope Moving range X-Y axis : 2" * 2",  Z axis : 50.8mm
Switching lens mode Microscope tilting 30°manually by Lever
Magnification 16~100X / 20~4000X
Lens specification Eyepiece: 10X ; Objective lens : 5X, 10X, 20X, 50X 100XOption
CCD pixels 50W (Analog) / 200W (Digital) / 500W (Digital)
Micropositioner X-Y-Z Travel range 12mm-12mm-12mm / 8mm-8mm-8mm
Mechanical resolution 10μm / 2μm / 0.7μm / 0.1μm
Current leakage accuracy Coaxial 1pA/V @25°C; Triaxial 100fA/V @25°C; Triaxial 10pA@3kv @25°C,
Test conditions: dry environment with ground shielding (air dew point below -40°C)
Cable connectors Banana head / Crocodile clip /  Coaxial / Triaxial / SMA / K
Application IC/ LD / LED / PD test, PCB /Packaged IC test , RF test under High and low temperature
Optional Accessories Probe clamp
Dark field of microscope / DIC / Normarski Testing light intensity / wavelength testing
RF Testing
High voltage and high current test
Shielding box
Special adapter
Vibration free table
Gold-plated chuck
Coaxial / Triaxial chuck
Light intensity / Spectrum / Wavelength test
Active probe
Low current / Capacitance test
Intergartion of intergral sphere
Fixture of Packaged IC test
Fixture of PCB test
Special Custom design
Low temperature test in non-vacuum environment Comfortable large handle, Driver Screws: Zero back lash
Compatible with high magnification metallographic microscope 0.2 um or above  internal circuit / electrode / PAD probe
Suitable in University and Research laboratory LD/LED/PD Light intensity / wavelength testing
Up to 12 inch wafer testing IV/CV Characteristic testing of materials / devices
High precision lead screw drive structure, linear movement High frequency characteristic test of devices (up to 300GHz )

Customer Service
Request for quotationRequest for quotation
Contact number

Contact number

0755-2690 6952 turn 801/804/806/814

Send EmailSend Email
© 2023 SEMISHARE CO., LTD. All Rights Reserved.粤ICP备19119103号