Our website uses cookies provided by us and third parties. Some cookies are necessary for the operation of the website, and you can adjust other cookies at any time, especially those that help us understand the performance of the website, provide you。

I accept
Phone Number*
Company Name:




SEMISHARE brings third-generation semiconductor test solutions to the 2023 CSIF summit forum

Release time:2023-08-29Source: SEMISHARE

Perfect Ending

On August 25, the two-day CSIF 2023 third-generation semiconductor material manufacturing and equipment technology summit forum came to a perfect conclusion. The event site was full of grand occasions, attracting nearly a thousand visitors. SEMISHARE and many domestic high-quality suppliers gathered together to help three and a half generations of enterprises complete "cost reduction and efficiency increase".

Test Solutions for Third Generation Semiconductors

Maximum voltage 10Kv, maximum current 500A

6 inches to 12 inches, manual/semi-automatic/automatic


mΩ level chuck contact resistance

Support thin slice, taiko, warped wafer test

Complete set of high pressure and high flow probes

High-performance airtight darkroom effectively shields EMI, light and noise while keeping dry and positive pressure environment samples without frosting at low temperatures

The optimized cavity structure of the darkroom can greatly reduce the consumption of drying gas

High voltage protection

High pressure gold plated chuck

High voltage and high current probe

High efficiency and high precision

Exhibition Preview

On November 23-25, 2023, SEMISHARE will attend the Ninth National Symposium on New Semiconductor Power Devices and Application Technology and the Third Generation Semiconductor Industry Integration Innovation Development (Guangzhou) Forum in Guangzhou.

Looking forward to your visit

Communicate and discuss with our engineers face to face!

© 2023 SEMISHARE CO., LTD. All Rights Reserved.粤ICP备19119103号