ThreeInone technology is to provide a kind of probe bench with high stability performance and semi-automatic wafer testing equipment. Through the stable structure of probe bench with low center of gravity, the problem that the equipment is easy to shake and affect the test accuracy in wafer testing is solved. Finally, the work of probe bench with high stability performance is guaranteed to make the test reach high precision.
(Three ZOOM) 3-fold imaging system
SEMISHARE 3 ZOOM patent microscope, the industry's unique multi-field tripling with the same focal optical path system, optical 120X 2000X magnification, size multi-field display at the same time, can make the point needle more convenient operation;It can be used with semi-automatic X series probe bench to meet the testing requirements of wafer and various devices, with high compatibility and significantly improving the testing efficiency.
Application direction: Various kinds of devices Wafer et al conduct characteristics analysis of I-V C-V optical signal RF 1/ F noise, etc., RF test, high-power Wafer test, etc.
X series is currently the fastest test run in the industry (& GT;70mm/s) is a semi-automatic wafer probe platform with the highest test accuracy (1 m). It is specialized in testing the performance of various advanced chips and integrates various functions such as electric light wave and microwave. Meanwhile, it has the highest temperature wide area (-60-300) in the industry, which can match various test application environments and effectively improve the test efficiency by over 40%.Equipped with rich software testing functions, it provides excellent reliability testing for all kinds of advanced wafer devices, greatly improving the technological level and yield rate of tested products.
High-performance technology provides a highly stable fully automatic wafer probe table and fully automatic wafer test equipment. Through the multi-reinforcement stable structure of fully automatic wafer probe table, it solves the problem that the equipment is easy to shake during wafer test and affects the test accuracy, thus ensuring the motion stability and precision of the probe table during wafer test.
Application direction: Wafer testing, all kinds of devices, Wafer, etc., for i-V, C-V, optical signal, RF, 1/ F noise and other characteristics analysis, RF testing, etc.
A series is the first high-end domestic independent research and development production of fully automatic production prober, the probe station has high testing precision and super fast test speed, the world first-class temperature control system, has automatic up-down material, automatic wafer alignment, automatic wafer center, automatic test diesize, etc, has the identification function of wafer ID at the same time, can be A single point test can also be continuous testing, test software feature-rich, while to ensure that the test precision has high testing speed, heavily for the enterprise to gain test speed, greatly improve the productivity and efficiency.
SEMISHARE advanced wafer probe technology has been widely used in the semiconductor industry panel industry research institutes and universities more than 1000 domestic customers, help the industry application, promote the overall development of the semiconductor industry in China.