Widely used in I-V/C-V testing, RF/mmW testing, high-power, high-current testing, MEMS, optoelectronic device testing, wafer-level failure analysis, Hall testing, etc.
LD/LED/PD Light intensity/wavelength test electrode /PAD test PCB/ package device Test material/device IV/CV characteristic test device high-frequency characteristic test (up to 300GHZ frequency) rf test, etc.
It is suitable for scientific research and analysis of nano micro devices, spot check and detection, etc
Low temperature test in high and low temperature non-vacuum environment, up to -100.
SCG launched series is the first domestic company independent research and development of high and low temperature vacuum prober, in ultra high vacuum, automatic control, laser simulation plays a SEMISHARER unique technical advantages, is an innovative SEMISHARE technology accumulated for years.
FA series probe bench is a kind of measuring equipment specially designed for failure analysis laboratory. It has optical characteristic, laser characteristic, stable equipment structure, excellent system performance, ergonomic design, convenient operation, support multi-function upgrade, and rich and complete product functions.
X series is an integrated and highly efficient semi-automatic wafer probe platform that is specialized in testing the performance of various advanced chips.
Wafer testing of various kinds of devices Wafer and other Wafer performed RF testing and other characteristics analysis of I-V C-V optical signal RF 1/ F noise, etc.
TEG series panel laser probe platform is mainly used to analyze THE TEG circuit of LCD screen, test electrical parameters, and realize a fully automated testing application equipment.This product can quickly and accurately analyze and judge the performance of the product, and further repair the defects of the product, greatly improving the yield and economic benefits of the enterprise production.