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Automatic Prober/Probe Stations at SEMISHARE Prober

Automatic prober/probe stations of SEMISHARE Probe are designed to revolutionize your semiconductor testing processes. Learn more today about our products.

 

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More details revealed | SEMISHARE A12 fully automatic probe station pre-order has been opened

A12 is a 12-inch (8-inch compatible) high-performance wafer test probe station. The equipment can be used in combination with different types of ATE testers. By making precise contact between the probe card and the wafer, the wafer-level For testing, the equipment is easy to operate and has good mechanical stability. It can provide customers with a low-cost ...

Automatic Prober/Probe Stations at SEMISHARE Prober

Automatic prober/probe stations of SEMISHARE Probe are designed to revolutionize your semiconductor testing processes. Learn more today about our products.

Semi-Automatic Probe Station Measurement Technology

ThreeInone™ technology provides a high-stability probe bench and semi-automatic wafer testing equipment. Through the stable structure of low center of gravity, the problem that the equipment is easy to shake and affect the test accuracy in wafer test

Product OverviewFunctional structureSpecificationsDownload
A Series Full Automatic Probe Station

Product Overview

A series is SEMISHARE years carefully developed a production automatic high and low temperature probe, the probe station has high test precision and super fast test speed, with automatic up-down material, automatic wafer alignment, automatic wafer center, automatic test diesize, etc, has the identification function of wafer ID at the same time, can be a single point test can also be continuous testing, test software feature-rich, heavily for the enterprise to gain test speed, greatly improving the productivity and efficiency.

Basic Information

Product numberA8, A12working environmentOpen type
electricity demand220 V, 50/60HzControl methodFull-Automatic
Product SizeA8(1124 x 1111 x 925) ;A12(1600 x 1660 x 1450)equipment weight1.2T, 2T

Application direction

Wafer testing of various kinds of devices Wafer and other Wafer performed RF testing and other characteristics analysis of I-V C-V optical signal RF 1/ F noise, etc.

Technical characteristics

A8 Full Automatic Prober

●High precision and test speed, greatly improving test efficiency ●Micron-scale fully closed-loop motion control ●High voltage and high current test application ●Bernoulli arm support sheet ●Small size, light weight, smaller footprint ●24X7 hours on-chip detection

A12 Full Automatic Prober

●Super high test precision and test speed, greatly improve productivity benefits. ●Fully automated system running, fast safe and reliable test. ●Support single point testing and continuous testing. ●Integrated control system, fast access to instrument testing. ●CHUCK efficient test system, running speed exceeding 300mm/s. ●Rich software automation test, precise mechanical precision calibration. ●Automatic wafer thickness measurement and ID reading card can be upgraded. ●Leading internal anti - shock system device, more stable operation.

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Contact number

0755-2690 6952 turn 801/804/806/814

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