Our website uses cookies provided by us and third parties. Some cookies are necessary for the operation of the website, and you can adjust other cookies at any time, especially those that help us understand the performance of the website, provide you。

I accept
Phone Number:
Company Name:
Contact Us
Send Email
  • 全球-简体中文
  • Global-English
  • Product Overview Functional structure Specifications Download

    FA8-Inch Failure Analysis Probe Station

    Product Overview

    FA series probe bench is a kind of measuring equipment specially designed for failure analysis laboratory. It has optical characteristic, laser characteristic, stable equipment structure, excellent system performance, ergonomic design, convenient operation, support multi-function upgrade, and rich and complete product functions.

    Basic Information

    Product number FA8 working environment Open type
    electricity demand 220VC,50~60Hz Control method Manual Probe Station
    Product Size 960mm long *850mm wide *1500mm high equipment weight About 260 kg

    Application direction

    Chip Failure Analysis AT room temperature and high and low temperature rf device Failure analysis MATERIAL/device IV/CV characteristic test and Failure analysis Chip internal circuit/electrode /PAD test IC/ panel internal circuit modification/layer removal.

    Technical characteristics

    Product Feature

    ●Large handle drive, no clearance movement. ●Ergonomic design, convenient and comfortable to operate. ●Multi-band laser application, fast switching and accurate cutting. ●Compatible with high power metallographic microscope for fine adjustment and movement. ●No backtrip difference design, accurate positioning. ●The air cooling structure is compact and requires no maintenance. ●High precision system, laser machining accuracy up to 1*1um. ●Leading internal anti - shock system device, more stable operation.

    Model FA series
    Model FA-8 FA-8-SC
    Dimension L: 960mm*W: 850mm*H: 1500mm L: 880mm*W: 860mm*H: 1550mm
    Weight (about) 260KG 280KG
    Electricity Demand 220VC, 50~60Hz
    Chuck  Size & Rotation angle  8", 360° Rotation
    X-Y travel range  8" * 8"  
    Moving resolution  1μm
    Sample fixed mode  Vacuum adsorption Vacuum adsorption
    Temperature control range - - 80~200
    Quick pull out - yes
    Electrical design Chuck Surface is Electrical Floating with Banana
     plug adapter, can be used as a backside electrode.  
    Platen Specification U shape Platen, 10 micropositioners available O shape Platen, 12 micropositioners available
    Travel & adjustment mode Platen can be quickly lifted up and down 6mm with automatic locking function,Platen can be fine 
    tuned up and down 25mm precisely with 1μm resolution   
    Microscope Travel range X-Y: 2" * 2",            Z: 50.8mm X-Y: 1" * 1",            Z: 50.8mm
    Resolution 1μm
    Magnification 20 ~ 4000X
    Operation of lens switching                    Fast tilting Pneumatic lifting
    CCD pixels 50W (Analog) / 200W (Digital) / 500W (Digital)
    Laser Wavelength Wavelength selectable: 1064/532/355/266nm
    Output power 0~2.2mJ/pulse 
    Micromachining capability Machinable material: Cr / Al / ITO / Ni / TFT / RGB / Poly Silicon / Mo / SiN / CF internal impurity etc.
    Precision Minimum Machinable size is 1*1μm (when using 100X lens)
    Cooling mode Air-cooled laser or Water cooled laser
    Micropositioner  X-Y-Z moving range 12mm-12mm-12mm / 8mm-8mm-8mm
    Mechanical resolution 2μm / 0.7μm / 0.1μm 
    Current leakage accuracy  10pA / 100fA (with Shielding Box)
    Cable connectors Banana head / Crocodile clip / Coaxial / Triaxial 
    Optional Accessories  Chuck fast pull-out mechanism
    Hot spot detection by liquid crystal package
    High voltage / high current test suite
    Hot chuck
    Shielding box
    Special adapter
    Vibration free table
    Gold-plated chuck
    Coaxial / Triaxial chuck
    Chuck Z quickly lifting and lowering and fine adjustment selection
    Light intensity / wavelength test
    RF test accessories
    Active probe
    Low current / Capacitance test
    Fixture for Fibre optic coupler test 
    Fixture of Packaged IC test accessory
    Fixture of PCB test accessory 
    Special Custom design
    Application Failure analysis of IC/LCD/OLED in varing temperature environment
    Failure analysis                             Comfortable large handle, Driver Screws: Zero back lash 
    Chip hot spot detection by liquid crystal                             Internal circuit/ electrode/ PAD probe 
    Laser cut ,ablation and selectively remove                             RF Devices characteristic 
    Applicable to the internal line modification /
    repair of the IC/LCD panel
                               IV / CV characteristic test and failure analysis of Materials / Devices
    Up to 12 inch wafer testing                            Laser minimum machining size 1*1μm

    Customer Service
    Procurement Messages

    Contact number

    0755-2690 6952 turn 801/804/806/814

    Send Email
    © 2020 SEMISHARE CO., LTD. All Rights Reserved.ICP 19119103