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Test Solution

Solution

解决方案

样品变温台

三轴转接头/线缆

射频探头

探针

探针夹具

探针座

激光修复机

探针台

LCD/OLED激光修复机

Flex激光面板亮点修复机

TEG面板激光探针台

A系列全自动探针台

X系列半自动探针台

CG系列高低温真空探针台

C系列高低温探针台

FA系列失效分析探针台

H系列综合型探针台

E系列经济型探针台

M系列简易型探针台

气浮式卡盘移动技术

真空高低温环境测试技术

半自动探针台测量技术

全自动探针台测量技术

超高气压环境

低温真空环境

高功率器件测试

高频测试

高校教育实验

OLED面板阵列修复方案

LCD面板阵列修复方案

OLED面板亮点修复方案

TFT-LCD 液晶面板亮点修复方案

软件

激光修复机

探针台

企业资料

面板行业

半导体行业

科研院所

大学院校

面板行业公司

半导体行业

研究院所

大学院校

往期展会

展会预告

管理

市场营销

销售

供应链服务

生产制造

研发

团建活动

培训活动

晶圆高低温测试方案

往期活动

活动预告

其它核心技术

关联产品

一种高低温真空探针台测试测量技术

一种全自动晶圆探针台测试测量技术

一种气浮式卡盘移动技术

A12半动自探针台

探针台

社会招聘

晶圆尺寸

控制方式

工作环境

应用功能

职位类别

工作地点

校园招聘

职位类别

工作地点

管理

LCVD激光修复机

测试软件

霍尔效应测试系统

Probe Station System

Laser Repair System

Test System

TEG Panel Probe Station

A Series Automatic Probe Station

X Series Semi-Automatic

FA Series/Failure Analysis

CG Series/High And Low Vacuum

C Series/High/Low Temperature

H Series/High Configuration

E Series/cost effective

M Series/basics Model

LCVD Laser Repair System

LCD/OLED Laser Repair System

Flex Laser Panel Repair System

Hall Effect System

Team Building Activities

Training Activities

Temperature Chuck

Adapter

RF Probe

Probe

Probe Holder

Micropositioner

Probe Station

Social Recruitment

Campus Recruitment

Job Categories

Working Cities

Job Categories

Working Cities

Wafer Size

Automation Level

Working Environment

Application

Past activities

Upcoming events

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Corporate Information

Software

Laser Repair System

Probe Station

OLED Panel Array Repair Solution

LCD Panel Array Repair Solution

OLED Panel Bright Spot Repair Scheme

TFT-LCD Panel Bright Spot Repair Program

Ultra High Pressure Environment

Low Temperature Vacuum Environment

Wafer High And Low Temperature Test Scheme

High Frequency Measurement

Air - Floating Chuck Moving Technology

Vacuum High And Low Temperature Environment Testing Technology

Semi-Automatic Probe Station Measurement Technique

Automatic Probe Station Measurement Technique

Other Core Technologies

Related Products

Special Conditions™

High-Performance™

Chuck Air bearing move ™

A12 Automatic Probe Station

anti vibration table

Test Service

Optoelectronic device testing

High-Power Device Testing

Wafer Test Solution For College Education Experiment

CGX Series/High And Low Vacuum

Mask Cut Repair L14

Mask LCVD Repair LD14

SR Series Fully Automatic Four-Probe Square Resistance Test System

Stations de sonde semi-automatiques sous vide à haute/basse température de la série CGX

Machine de découpe et de réparation des masques L14

Machine de réparation LCVD des masques LD14

Système de Test de Résistance Carrée à Quatre Pointes Entièrement Automatique de la Série SR

Stations de sonde

Machines de réparation laser

Systèmes d'essai

Station de Sonde à Panneau TEG

Stations de sonde entièrement automatiques de la série A

Stations de sonde semi-automatiques de la série X

Série FA / Analyse des Défaillances

Stations de sonde sous vide à haute/basse température de la série CG

Série C / Température Élevée/Basse

Série H / Configuration Haut de Gamme

Série E / Rentable

Série M / Modèle de Base

Machine de réparation laser des panneaux LCVD

Machine de réparation laser des panneaux LCD/OLED

Machine de réparation laser des points lumineux des panneaux Flex

Système à Effet Hall

Air - Floating Chuck Moving Technology

Vacuum High And Low Temperature Environment Testing Technology

Semi-Automatic Probe Station Measurement Technique

Automatic Probe Station Measurement Technique

Other Core Technologies

Related Products

Special Conditions™

High-Performance™

Chuck Air bearing move ™

A12 Automatic Probe Station

Environnement à ultra haute pression

Environnement sous vide à basse température

Schéma de test des hautes et basses températures des plaquettes

Mesure haute fréquence

Test de dispositifs optoélectroniques

Tests d'appareils à haute puissance

Solution de test de wafer pour les expériences éducatives universitaires

Solution de réparation de la matrice des dalles OLED

Solution de réparation de l’array des dalles LCD

Schéma de réparation des points lumineux sur les dalles OLED

Programme de réparation des points lumineux sur les dalles TFT-LCD

Software

Machines de réparation laser

Stations de sondes

Documents de l'entreprise

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Past activities

Upcoming events

Team Building Activities

Training Activities

Temperature Chuck

Adapter

RF Probe

Probe

Probe Holder

Micropositioner

anti vibration table

Stations de sonde

Social Recruitment

Campus Recruitment

Job Categories

Working Cities

Job Categories

Working Cities

Taille de la plaquette

Niveau d'automatisation

Environnement de test

Fonctions d'application

Test Service

CGX Serie/Hoch- und Niedrigvakuum

Maskenschneidereparatur L14

Maske LCVD-Reparatur LD14

SR Serie Vollautomatisches Vier-Punkt-Widerstandsmesssystem

Probestation

Lasermaschine zur Reparatur

Testsysteme

TEG-Panel-Prüfstation

Eine automatische Probestation der Serie A

X Serie Halbautomatisch

FA Serie/Fehleranalyse

CG Serie/Hoch- und Niedrigvakuum

C Serie/Hohe/Niedrige Temperatur

H Serie/Hochkonfiguration

E Serie/Kosteneffektiv

M Serie/Basis-Modell

LCVD-Laserreparatursystem

LCD/OLED-Laserreparatursystem

Flexibles Laser-Panel-Reparatursystem

Hall-Effekt-System

Temperature Chuck

Adapter

RF Probe

Probe

Probe Holder

Micropositioner

anti vibration table

Test Service

Wafer Alignment™-Technologie

Hochpräzise Contact™-Technologie

Semi-Automatic Probe Station Measurement Technique

Automatic Probe Station™-Technologie

Other Core Technologies

Related Products

Special Conditions™

High-Performance™

Chuck Air bearing move ™

A12 Automatic Probe Station

Ultrahochdruckumgebung

Niedrigtemperatur-Vakuumumgebung

Wafer Hoch- und Niedertemperatur-Testschema

Hochfrequenzmessung

Optoelektronische Gerätetests

Hochleistungsgerätetest

Wafer-Testlösung für Hochschulausbildungsversuche

OLED Panels Array Reparatur

LCD Panels Array Reparatur

OLED Panels Bright Spot Reparatur

TFT LCD Panels Bright Spot Reparatur

Software

Laser-Reparatursystem

Probestation

Unternehmensunterlagen

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Past activities

Upcoming events

Team Building Activities

Training Activities

Probestation

Social Recruitment

Campus Recruitment

Job Categories

Working Cities

Job Categories

Working Cities

Wafergröße

Automatisierungsgrad

Testumgebung

Anwendungsfunktionen

Serie CGX/Alto e Basso Vuoto

Riparazione Taglio Maschera L14

Riparazione Maschera LCVD LD14

Sistema di Test di Resistenza Quadra a Quattro Sonde Completamente Automatico della Serie SR

Stazione-della-sonda

Sistema di Riparazione Laser

Sistema di test

Stazione di Prova per Pannelli TEG

Stazione di prova automatica della serie A

Serie X Semi-Automatica

Serie FA/Analisi dei Guasti

Serie CG/Alto e Basso Vuoto

Serie C/Alta e Bassa Temperatura

Serie H/Configurazione Elevata

Serie E/Conveniente

Serie M/Modello di Base

Sistema di Riparazione Laser LCVD

Sistema di Riparazione Laser per LCD/OLED

Sistema di Riparazione Flessibile a Laser per Pannelli

Sistema ad Effetto Hall

Temperature Chuck

Adapter

RF Probe

Probe

Probe Holder

Micropositioner

anti vibration table

Test Service

Tecnologia Wafer Alignment™

Tecnologia SpecialConditions™

Tecnologia High-accuracy Contact™

Tecnologia Automatic Probe Station™

Other Core Technologies

Related Products

Special Conditions™

High-Performance™

Chuck Air bearing move ™

A12 Automatic Probe Station

Ambiente ad Ultra Alta Pressione

Ambiente a Vuoto a Bassa Temperatura

Schema di Test ad Alta e Bassa Temperatura per Wafer

Misurazione ad Alta Frequenza

Test dei Dispositivi Fotoelettronici

Test dei Dispositivi ad Alta Potenza

Soluzione di Test per Wafer per Esperimenti di Formazione Universitaria

Piano di riparazione dell'array del pannello OLED

Piano di riparazione dell'array del pannello LCD

Piano di riparazione dell'array del pannello OLED

Piano di riparazione per i punti luminosi del pannello TFT-LCD

Software

Macchina di riparazione laser

Stazione della sonda

Dati aziendali

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Past activities

Upcoming events

Team Building Activities

Training Activities

Stazione della sonda

Social Recruitment

Campus Recruitment

Job Categories

Working Cities

Job Categories

Working Cities

Dimensione del wafer

Livello di Automazione

Ambiente di test

Funzione di applicazione

Serie CGX/Alto y Bajo Vacío

Reparación de Corte de Máscara L14

Reparación de Máscara LCVD LD14

Serie SR / Sistema de Prueba de Resistencia en Cuadrado de Cuatro Puntas Totalmente Automático

Estación de sonda

Sistema de Reparación Láser

Sistema de prueba

Estación de Pruebas de Panel TEG

Estación de Pruebas Automática de la Serie A

Serie X Semiautomática

Serie FA / Análisis de Fallos

Serie CG/Alto y Bajo Vacío

Serie C/Alta y Baja Temperatura

Serie H / Alta Configuración

Serie E / Rentable

Serie M / Modelo Básico

Sistema de Reparación Láser LCVD

Sistema de Reparación Láser LCD/OLED

Sistema de Reparación de Panel Láser Flex

Sistema de Efecto Hall

Temperature Chuck

Adapter

RF Probe

Probe

Probe Holder

Micropositioner

anti vibration table

Test Service

Tecnología Wafer Alignment™

Tecnología Special Conditions™

Tecnología High-accuracy Contact™

Tecnología Automatic Probe Station™

Other Core Technologies

Related Products

Special Conditions™

High-Performance™

Chuck Air bearing move ™

A12 Automatic Probe Station

Entorno de ultra alta presión

Prueba de alta y baja temperatura en vacío

Prueba de obleas de alta y baja temperatura

Medición de alta frecuencia

Prueba de fotoelectricidad

Prueba de dispositivos de alta potencia

Solución de prueba de obleas para experimentos de educación universitaria

Programa de reparación de matrices del panel OLED

Programa de reparación de matrices del panel LCD

Programa de reparación de puntos brillantes del panel OLED

Programa de reparación de puntos brillantes del panel TFT-LCD

Software

Sistema de láser

Estación de sonda

Datos de la empresa

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Past activities

Upcoming events

Team Building Activities

Training Activities

Estación de sonda

Social Recruitment

Campus Recruitment

Job Categories

Working Cities

Job Categories

Working Cities

Tamaño de la oblea

Nivel de automatización

Entorno de prueba

Funciones de aplicación

V Series New Generation High Performance Prober

Stations de sonde de la série V

V-Serie Hochleistungs-Probestation

Stazione della sonda ad alte prestazioni serie V

Estación de sonda de alto rendimiento Serie V

CGXシリーズ/高低真空対応

マスクカット修理L14

マスクLCVD修理LD14

SRシリーズ全自動四探針式方形抵抗テストシステム

プローブステーションシステム

レーザー修理システム

テストシステム

TEGパネル用プローブステーション

Aシリーズ自動プロービングマシン

Xシリーズ半自動プロービングマシン

FAシリーズ/故障解析

CGシリーズ/高低真空対応

Cシリーズ/高低温対応

Hシリーズ/高性能仕様

Eシリーズ/コストパフォーマンス型

Mシリーズ/基本モデル

LCVDレーザー修復システム

LCD/OLEDレーザー修理システム

フレックスレーザーパネル修理システム

ホール効果測定システム

Vシリーズ 新世代高性能プローバ

プローブとウェーハテストポイント間の接触精度を向上させる方法及び装置

低温プローブテスト装置

ウェーハアライメント方法及び関連装置

全自動ウェーハテスト装置及び方法

Other Core Technologies

Related Products

Special Conditions™

High-Performance™

Chuck Air bearing move ™

A12 Automatic Probe Station

超高圧環境

低温真空環境

ウェハ高低温試験ソリューション

高周波測定

光電子デバイステスト

高電力デバイステスト

大学教育実験向けウェハテストソリューション

OLEDパネルアレイ修復ソリューション

LCDパネルアレイ修復ソリューション

OLEDパネル輝点修復スキーム

TFT-LCDパネル輝点修復ソリューション

ソフトウェア

レーザー修復システム

プローブステーション

企業情報

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Past activities

Upcoming events

Team Building Activities

Training Activities

温度チャック(Temperature Chuck)

アダプター(Adapter)

RFプローブ(RF Probe)

プローブ(Probe)

プローブホルダー(Probe Holder)

マイクロポジショナー(Micropositioner)

防振テーブル

プローブステーション

中途採用

新卒採用

職種一覧

勤務地

職種

勤務地

ウェーハサイズ

自動化レベル

作業環境

アプリケーション

テストサービス

CGX 시리즈/고진공 및 저진공

마스크 커트 수리기 L14

마스크 LCVD 수리기 LD14

SR 시리즈 전자동 4-프로브 저항 측정 시스템

프로브 스테이션 시스템

레이저 수리 시스템

테스트 시스템

TEG 패널 프로브 스테이션

A 시리즈 자동 프로브 스테이션

X 시리즈 반자동

FA 시리즈/결함 분석

CG 시리즈/고진공 및 저진공

C 시리즈/고온·저온

H 시리즈/고급 구성

E 시리즈/비용 효율적

M 시리즈/기본 모델

LCVD 레이저 수리 시스템

LCD/OLED 레이저 수리 시스템

플렉스 레이저 패널 수리 시스템

홀 효과 시스템

V 시리즈 신형 고성능 프로버

프로브와 웨이퍼 테스트 포인트 간의 접촉 정확도를 향상시키는 방법 및 장치

저온 프로브 테스트 장치

웨이퍼 얼라인먼트 방법 및 관련 장치

완전 자동 웨이퍼 테스트 장치 및 방법

Other Core Technologies

Related Products

Special Conditions™

High-Performance™

Chuck Air bearing move ™

A12 Automatic Probe Station

초고압 환경

저온 진공 환경

웨이퍼 고저온 테스트 솔루션

고주파 측정

광전자 소자 테스트

고출력 장치 테스트

대학 교육 실험용 웨이퍼 테스트 솔루션

OLED 패널 어레이(Array) 수리 솔루션

LCD 패널 어레이(Array) 수리 솔루션

OLED 패널 밝은 점(Bright Spot) 수리 솔루션

TFT-LCD 패널 밝은 점(Bright Spot) 수리 프로그램

소프트웨어

레이저 수리 시스템

프로브 스테이션

기업 정보

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Panel Industry

Semiconductor Industry

Research Institute

Colleges And Universities

Past activities

Upcoming events

Team Building Activities

Training Activities

온도 척(Thermal Chuck)

어댑터(Adapter)

RF 프로브(RF Probe)

프로브(Probe)

프로브 홀더(Probe Holder)

마이크로포지셔너(Micropositioner)

진동 방지 테이블

프로브 스테이션

사회 채용

캠퍼스 리크루트먼트

직무 분류

근무 도시

직무 분류

근무 도시

웨이퍼 크기

자동화 수준

근무 환경

응용 분야

테스트 서비스

Silicon Photonics Testing

LCD panel manufacturing is divided into an Array, the Cell, such as the Module is installed in a series of technological process each process will produce some process defects, such as dim bright flash point of these defects such as broken window will cause local show bad, but we can through the laser line cut, welding, darkening method to repair or fade in the actual production in about 5% of the point defects, with a laser repair or fade out after, can promote panel product yield, and reduce the production cost of the panel companies.

Point defect is the most common problem of the LCD panel, the LCD panel manufacturing process, including dust organic metal foreign bodies will be adsorption to the LCD panel when the utensil was to close to the color filter area, corresponding to the color filter pixels emit a much brighter than the rest of the normal pixel light, which is referred to as a pixel point Semishare joint American ESI to become the industry's first flexscan technology being developed for the pixel window, BM repair and DM repair.



BM Repair(Black Matrix Diffusion)

BM repair laser was mainly used in need of repair of the pixel color film and glass substrate is formed between clearance, and then use laser to the pixels around the graining of the black matrix processing, and will produce the black particles into the gap, repeating the process until the black particles is covered on the pixel, finally complete the repair.

DM Repair(Direct Method)

DM repair is to carbonize CF or ITO on transparent electrode of pixel bright spot by directly acting on CF(color filter) or ITO with high energy ultra-fast laser, so as to achieve the purpose of darkening the bright spot.

SEMISHARE FlexScan BM&DM Repair Equipment (Advantage Highlights)

The SEMISHARE FlexScan BM&DM laser repair equipment is suitable for the small size of the LCD panel window in the large defect repair with fast, uniform, and yield was significantly higher than that of traditional BM, the characteristics of the DM technology, have CCD automatic detection function, can automatically find and locate precisely to bad point, after the completion of the repair process, automatically complex sentence selected automatically according to the results of the complex sentence or repair under the expected, the entire journey without too much manual intervention, which can ensure the quality of repair, also can greatly improve repair efficiency.


SEMISHARE Flexscan technology solves the defects in panel manufacturing process, breaks the technical boundary of the industry, and occupies a leading position in the industry, providing panel enterprises with more comprehensive solutions, helping them to improve product yield and reduce production costs.

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