Hall Effect System is integrated Keithley2400/2600 series precision source and Semishare Polaris high and low temperature platform, using van der pol rule design, applied to the high precision of measuring carrier type of semiconductor material type (P/N) concentration of carrier mobility parameters such as resistivity hall coefficient, can be applied to Si SiGe SiC GaAs InGaAs InP semiconductor materials such as GaN.
|Windows98 / ME / 2000 / NT/XP environment
● The industry-leading Keithley testing platform.
● Ultra high precision source table, achieve accurate measurement.
● Modular design, stable performance and simple maintenance.
● Rich software functions, convenient and flexible operation.
● Visual interface, data analysis is clear.
● High and low temperature variable temperature environment, effective implementation of reliability testing.