SEMISHARE Showcases Advanced Wafer Prober at
the 7th Global Electronic Technology Exhibition（Chongqing）
2025.5.8-10
The 7th Global Semiconductor Industry and Electronics Technology (Chongqing) Expo successfully concluded its three-day run from May 8th to 10th. Covering an exhibition area of 40,000㎡, the event gathered 800 exhibitors and attracted 35,000 professional visitors.
As a highlight exhibitor, SEMISHARE showcased its advanced wafer probe stations, demonstrating the company's latest technological developments and application innovations in semiconductor wafer testing to industry professionals in China's western region. The exhibition provided an excellent platform for SEMISHARE to strengthen regional market presence and explore new business opportunities in semiconductor testing solutions.
On-site Exhibiton Overview
Advance Wafer Probe Station
A Series Full Automatic Probe Station
●Supports WAT and CP testing for 12"/8"/6" wafers
●Micron-level fully-closed-loop motion control enables high-precision automatic probing
●Rapid temperature control mode (-50°C to 200°C)
●XY max speed: 250mm/s (screw drive); 500mm/s (linear motor)
●Index time: 280ms (screw drive); 200ms (linear motor)
●Handler compatible with ultrathin/warped/blue tape/Taiko wafers
●Proprietary integrated hinge design supports interface with any tester
●Custom solutions available including package-level testing, frame wafer testing, dual-port testing, motorized probe card testing, and Kelvin (4-wire) measurement.
The X-Series Semi-Automatic Probe Station
●Advanced PAS™ structural design
●Integrated air-film vibration isolation system
●Proprietary temperature control system
●Intelligent objective lens anti-collision mechanism
●User-friendly UI with multi-functional operation buttons
●Z-axis adaptive height compensation system
●Genius Probing™ intelligent contacting technology
H-Series Manual Probe Station
The H-Series Probe Station delivers outstanding mechanical performance and advanced testing capabilities. Featuring innovative chuck movement technology, it enables highly efficient full-wafer testing to meet diverse customer requirements. With its UPStart™ modular open architecture, the H-Series can be equipped with various kits to achieve expanded testing functionalities. The H-Series 6"/8"/12" probe stations are particularly suitable for research laboratories seeking cost-effective, one-time procurement solutions.
Live Scene Highlights
Thank You for Joining Us
Journey Continues
Looking Forward to Our Next Encounter
Exhibition Preview: SEMICON SEA 2025 in Singapore
森美协尔
SEMISHARE
SEMISHARE (Shenzhen SEMISHARE Technology Co., Ltd.), founded in 2010, is a national high-tech enterprise, a national "Little Giant" specialized and sophisticated SME, and the Guangdong Provincial Advanced Wafer Probe Station Semiconductor Equipment Engineering Technology Research Center. The company specializes in the R&D, manufacturing, and sales of advanced wafer probe stations and comprehensive semiconductor test solutions.
The company is committed to providing customers with high-performance wafer probe stations (manual/semi-automatic/fully automatic) and integrated test solutions. Its equipment is widely used in WAT/CP testing, I-V/C-V testing, RF/mmW testing, high-voltage/high-current testing, MEMS, high & low-temperature testing, optoelectronic device testing, wafer-level failure analysis, and Hall testing. With over 1,000 served customers including universities, research institutes, and IC design/manufacturing/packaging & testing companies, SEMISHARE has accumulated extensive technical expertise and successful cases in semiconductor testing.
From the very beginning, SEMISHARE has embedded its mission into its corporate DNA: "To serve the chip industry, support China's independent development of leading-edge chips, and promote the global semiconductor industry." Through continuous technological innovation and a commitment to earning customer trust, SEMISHARE aims to become a world-renowned provider of semiconductor test equipment.