Our website uses cookies provided by us and third parties. Some cookies are necessary for the operation of the website, and you can adjust other cookies at any time, especially those that help us understand the performance of the website, provide you。

I accept
Name:
Phone Number:
Company Name:
mailbox:
Content:
Contact Us
Send Email
English
  • 全球-简体中文
  • Global-English
  • Product Overview Functional structure Specifications Download

    Hall Effect System

    Product Overview

    Hall Effect System is integrated Keithley2400/2600 series precision source and Semishare Polaris high and low temperature platform, using van der pol rule design, applied to the high precision of measuring carrier type of semiconductor material type (P/N) concentration of carrier mobility parameters such as resistivity hall coefficient, can be applied to Si SiGe SiC GaAs InGaAs InP semiconductor materials such as GaN.

    Basic Information

    Product number HALL working environment Windows98 / ME / 2000 / NT/XP environment
    electricity demand / Control method /
    Product Size / equipment weight /

    Application direction

    Technical characteristics

    Product Feature

    ● The industry-leading Keithley testing platform. ● Ultra high precision source table, achieve accurate measurement. ● Modular design, stable performance and simple maintenance. ● Rich software functions, convenient and flexible operation. ● Visual interface, data analysis is clear. ● High and low temperature variable temperature environment, effective implementation of reliability testing.


    Model HALL series
    Specification
    Brief introduction

    This system is integrated with Keithley 2400 / 2600 series high precision source meter and Semishare Polaris high

    and low temperature platform. It is designed by using The Van Der Pauw Law for high precision measurement of

    the carrier types of semiconductor materials (P type / N type),Carrier concentration, Mobility ratio, Resistivity,

    Hall coefficient and other parameters test, Can be applied to various materials such as Si,SiGe,SiC,GaAs,

    InGaAs,InP,GaN etc.

    Software operating system Under the environment of Windows 98 / ME / 2000 / NT / Xp
    Effective current output range 6nA~100mA
    Effective voltage measurement range -5~5V
    Carrier concentration(/cm3) 107 – 1021
    Mobility (cm2/Vs) 1~107
    Resistivity (Ohm.cm) 10-4 - 107
    A/B ratio Ok
    RHD(cm3/C) Ok
    RHC(cm3/C) Ok
    RH(cm3/C) Ok
    Sheet Resistance(Ohm) Ok
    Temperature Temperature (k): normal temperature and
    77k , two temperature points
    Option: 77k~500k 0. 1 degrees Celsius
    accuracy, can be set by software
    Instrument size and weight Mainframe size H: 89mm × W: 213mm × L: 370mm
    Weight 3.21KG
    Working environment requirements 0°–50°C, 70%R.H.
    Storage environment requirements –25°C to 65°C
    Dimention of the Van der pauw rule
    terminal converter
    200×120×110 mm (W×H×D)
    Net weight 7.7KG
    Measuring material All semiconductor films such as Si, SiGe, SiC, ZnO, GaAs, InGaAs, InP, GaN, ITO (p-type and n-type)
    Characteristic
    Keithley test platform Feature-rich software
    Ultra-high precision source meter User friendly UI
    Modular design High and low temperature environment

    Customer Service
    Procurement Messages

    Contact number

    0755-2690 6952 turn 801/804/806/814

    Send Email
    © 2020 SEMISHARE CO., LTD. All Rights Reserved.ICP 19119103