Unternehmen
Using prober semiconductor material qualitative analysis in the precise measurement of the main parameters, an integral test probe the application of several common types of probes: general DC active probe and microwave coaxial DC probe probes in the whole process of application, the probe surface w...
Details anzeigen >>
Is the applicable scope of the manual probe station for electric parameters test of IC chip provided a test platform, probe station integrated IC, can adsorption various specifications and provide several adjustable needle detection and its probe, interaction testing instrument for integrated circui...
Details anzeigen >>
As an intelligent carrier, chip has activated massive market demand. With the reduction of chip size and line, the requirements on testing equipment have become higher and higher, and the test of semiconductor material devices has become more and more important.
Details anzeigen >>
Thin film resistance is used in many devices. There are many thin film resistance devices in the battery machinery and equipment, which can reasonably improve the utilization rate of the battery and give full play to the battery management system to track the battery information. In general, accordi...
Details anzeigen >>