2024-03-28test
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2020-08-27Methods and procedures of chip failure analysis
Nothing but common methods also have some other means of failure analysis, atomic force microscope AFM, secondary positive ion mass spectrometry SIMS, aviation tof-sims time mass spectrometry analysis, transmission electron microscopy, TEM, send electron microscopy (sem), send the scanner auger elec...
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2020-08-27SEMISHARE participated in the 2017 IPFA International Conference on Integrated Circuit Physics and Failure Analysis
From July 4 to 7, 2017, the 24th International Conference on INTEGRATED Circuit Physics and Failure Analysis (IPFA2017) was held in The Ritz-Carlton Chengdu, Sichuan province, and Semishare was invited to participate in this grand event.
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2020-08-27How to clean the probe table probe to extend the service life of probe consumables
Using prober semiconductor material qualitative analysis in the precise measurement of the main parameters, an integral test probe the application of several common types of probes: general DC active probe and microwave coaxial DC probe probes in the whole process of application, the probe surface w...
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