Hall Effect System

Hall Effect System

Product Overview

Hall Effect System is integrated Keithley2400/2600 series precision source and Semishare Polaris high and low temperature platform, using van der pol rule design, applied to the high precision of measuring carrier type of semiconductor material type (P/N) concentration of carrier mobility parameters such as resistivity hall coefficient, can be applied to Si SiGe SiC GaAs InGaAs InP semiconductor materials such as GaN.

Basic Information

Product number	HALL	working environment	Windows98 / ME / 2000 / NT/XP environment
electricity demand	/	Control method	/
Product Size	/	equipment weight	/

Application direction

Technical characteristics

Product Feature

● The industry-leading Keithley testing platform.
● Ultra high precision source table, achieve accurate measurement.
● Modular design, stable performance and simple maintenance.
● Rich software functions, convenient and flexible operation.
● Visual interface, data analysis is clear.
● High and low temperature variable temperature environment, effective implementation of reliability testing.

Model HALL series
Specification

Brief introduction	This system is integrated with Keithley 2400 / 2600 series high precision source meter and Semishare Polaris high and low temperature platform. It is designed by using The Van Der Pauw Law for high precision measurement of the carrier types of semiconductor materials (P type / N type),Carrier concentration, Mobility ratio, Resistivity, Hall coefficient and other parameters test, Can be applied to various materials such as Si,SiGe,SiC,GaAs, InGaAs,InP,GaN etc.
Software operating system	Under the environment of Windows 98 / ME / 2000 / NT / Xp
	Effective current output range	6nA~100mA
	Effective voltage measurement range	-5~5V
	Carrier concentration(/cm3)	10⁷ – 10²¹
	Mobility (cm2/Vs)	1~10⁷
	Resistivity (Ohm.cm)	10^-4 - 10⁷
	A/B ratio	Ok
	RHD(cm3/C)	Ok
	RHC(cm3/C)	Ok
	RH(cm3/C)	Ok
	Sheet Resistance(Ohm)	Ok
	Temperature	Temperature (k): normal temperature and 77k , two temperature points
		Option: 77k~500k 0. 1 degrees Celsius accuracy, can be set by software
Instrument size and weight	Mainframe size	H: 89mm × W: 213mm × L: 370mm
	Weight	3.21KG
Working environment requirements	0°–50°C, 70%R.H.
Storage environment requirements	–25°C to 65°C
Dimention of the Van der pauw rule terminal converter	200×120×110 mm (W×H×D)
Net weight	7.7KG
Measuring material	All semiconductor films such as Si, SiGe, SiC, ZnO, GaAs, InGaAs, InP, GaN, ITO (p-type and n-type)
Characteristic
Keithley test platform	Feature-rich software
Ultra-high precision source meter	User friendly UI
Modular design	High and low temperature environment

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